Post by rwelch on Apr 15, 2010 12:24:33 GMT -5
Hello,
I am new to the AIM 4170C. My company is interested automating the impedance measurement of materials. Is there an API that allows full control of the device? I am LabView as my programming langue. I have tried two approaches thus far.
The first approach was the RS 232 interface. The gating issue I ran into there was interpreting the data returned on an “Fxxxxxxx” command. It looks like noise. Do I need to average this to see a sinusoidal waveform? If so is the signal in phase from sample to sample?
The other approach was using the datafile.txt/ $autoscan$.csv interface. The issue I ran into here was the inability to set the upper frequency below 1M. If I send anything less then .1 in the second field of the second line, the application (688D) rescans with the old parameters? Is this a bug or a limit of the application? Also, is there a way to interface with the application to close the application and set parameters such as the averaging?
Thanks in advance!
Rich
I am new to the AIM 4170C. My company is interested automating the impedance measurement of materials. Is there an API that allows full control of the device? I am LabView as my programming langue. I have tried two approaches thus far.
The first approach was the RS 232 interface. The gating issue I ran into there was interpreting the data returned on an “Fxxxxxxx” command. It looks like noise. Do I need to average this to see a sinusoidal waveform? If so is the signal in phase from sample to sample?
The other approach was using the datafile.txt/ $autoscan$.csv interface. The issue I ran into here was the inability to set the upper frequency below 1M. If I send anything less then .1 in the second field of the second line, the application (688D) rescans with the old parameters? Is this a bug or a limit of the application? Also, is there a way to interface with the application to close the application and set parameters such as the averaging?
Thanks in advance!
Rich
